YANG, Yi; WANG, Tao; CHANG, Yuzhou; ZHANG, Wei; TANG, Jiajun. Calibration and Uncertainty Analysis of Scanning Electron Microscope Length Measurement Error. Highlights in Science, Engineering and Technology, [S. l.], v. 126, p. 61–64, 2025. DOI: 10.54097/pga99876. Disponível em: https://hsetdata.com/index.php/ojs/article/view/16. Acesso em: 15 jun. 2026.