Advancing Beyond Silicon: Future Directions in Semiconductor Technology

Authors

  • Hongjun Hu

DOI:

https://doi.org/10.54097/wz7cwc74

Keywords:

Semiconductors, Silicon, GaN, SiC, 2D materials, MoS2.

Abstract

This essay delves into the semiconductor industry, emphasizing the developmental trajectory and challenges of silicon-based technologies. The introduction provides a foundational overview of semiconductors, with a specific focus on silicon and its limitations in high power and temperature scenarios. Methodologically, the analysis is rooted in a comprehensive literature review and data examination, ensuring a robust discourse. The core of the essay explores alternative materials and technologies that could potentially revolutionize the industry. New materials such as SiC and GaN are analyzed for their superior properties compared to silicon, including higher band gaps and thermal conductivities, which make them better suited for high power and temperature environments. Furthermore, the discussion extends to innovative 3D structure chips and the utilization of 2D materials like MoS2, highlighting their potential to enhance chip performance and reduce feature size. The conclusion synthesizes these insights, noting the current shortcomings of the alternatives and the ongoing need for research to fully realize their potential in practical applications.

Downloads

Download data is not yet available.

References

[1] Song, J.: 'The history and trends of semiconductor materials’ development', J. Phys.: Conf. Ser., 2023, 2608, (1), p. 012019.

[2] Wang, R., Zhu, J., Wang, S., Wang, T., Huang, J., Zhu, X.: 'Multi-modal emotion recognition using tensor decomposition fusion and self-supervised multi-tasking', International Journal of Multimedia Information Retrieval, 2024, 13(4), pp. 39.

[3] Xu, H., Zhu, X., Zhao, Z., Wei, X., Wang, X., Zuo, J.: 'Research of Pipeline Leak Detection Technology and Application Prospect of Petrochemical Wharf', IEEE ITAIC, 2020, pp. 263–271.

[4] Wei, X., Zhu, X., Wang, X., Zhao, Z., Zuo, J.: 'Fuzzy Fault Tree Analysis Method and Its Application in Fault Diagnosis of Denitration System in Thermal Power Plant', Proceedings of the 2020 8th International Conference on Information Technology: IoT and Smart City, 2020, pp. 227-232.

[5] Zhao, Z., Peng, Y., Zhu, X., Wei, X., Wang, X., Zuo, J.: 'Research on Prediction of Electricity Consumption in Smart Parks Based on Multiple Linear Regression', IEEE ITAIC, 2020, pp. 812–816.

[6] Zhu, X., Zhao, Z., Wei, X., Wang, X., Zuo, J.: 'Action recognition method based on wavelet transform and neural network in wireless network', Proc. 5th Int. Conf. Dig. Signal Process., 2021, pp. 60–65.

[7] Zhang, Y., Zhao, H., Zhu, X., Zhao, Z., Zuo, J.: 'Strain Measurement Quantization Technology based on DAS System', 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC), 2019, pp. 214-218.

[8] Sadulla, S.: 'Next-Generation Semiconductor Devices: Breakthroughs in Materials and Applications', Prog. Electron. Commun. Eng., 2024, 1, (1), pp. 13–18.

[9] Zhu, X., Zhang, Y., Zhao, Z., Zuo, J.: 'Radio frequency sensing based environmental monitoring technology', Fourth International Workshop on Pattern Recognition, 2019, Vol. 11198, pp. 187-191.

[10] Liang, D., Bowers, J. E.: 'Recent progress in heterogeneous III-V-on-silicon photonic integration', Light: Adv. Manuf., 2021, 2, (1), pp. 59–83.

Downloads

Published

18-02-2025

How to Cite

Hu, H. (2025). Advancing Beyond Silicon: Future Directions in Semiconductor Technology. Highlights in Science, Engineering and Technology, 125, 410-415. https://doi.org/10.54097/wz7cwc74